Blk 38, DEFU LANE 10 ,#03-07

Singapore 539215

Fax : 65-68411237
India Contact:
The Surface Technologies
Chennai 600063
Phone: +918939447523

Innovative metrology and characterization are becoming critical for development of nano/micro circuit technology and clean technology cluster. The progressive introduction of new materials, novel processing and assembly, and innovative devices  bring forth formidable metrology and diagnostic challenges in recent years due to rapid consumerization of silicon by the new generation. Advanced characterization has thus become a key enabler in improving nano-scale process technology as well as solar cell / LED manufacturing. A-IATS, as your first port of call addresses your analytical and test challenges on continual basis with its physical assets and intellectual capital arising from research labs and regional manufacturers. AIATS enables you to link composition, structure, morphology, roughness, adhesion and hardness with defect reduction, yield improvement and optimum performance enhancement for variation management.

Solder Interconnect Reliability Symposium

Dec 2016 Souvenir Hardcopy(Click Here)

A new symposium on IC NTERCONNECT RELIABILITY of advanced electronic package  is being planned at Utown, NUS, Singapore in 25-26  Sep  2017. All are invited. Please refer for more details .
Contact Dr Gopal Krishnan at 
We invite you for a free technical consultation every Tuesday at E MAGIC Lab/NUS at 1630 hours. Please contact for appointment