No 9, Kaki Bukit Road ,#01-18

Gordon Warehouse building

Singapore 417843

Fax : 65-68411237
India Contact:
Surface Technologies
Chennai 600063
Phone: 91 91769 30405

Innovative metrology and characterization are becoming critical for development of nano/micro circuit technology and clean technology cluster. The progressive introduction of new materials, novel processing and assembly, and innovative devices  bring forth formidable metrology and diagnostic challenges in recent years due to rapid consumerization of silicon by the new generation. Advanced characterization has thus become a key enabler in improving nano-scale process technology as well as solar cell / LED manufacturing. A-IATS, as your first port of call addresses your analytical and test challenges on continual basis with its physical assets and intellectual capital arising from research labs and regional manufacturers. AIATS enables you to link composition, structure, morphology, roughness, adhesion and hardness with defect reduction, yield improvement and optimum performance enhancement for variation management. Download the brochure for more information

Conference 2013
A new surface engineering conference is being planned at Chennai India on 7-9th August 2013. All are invited. Please refer to this website: Seria 2013 and contact
We invite you for a free technical consultation every Tuesday at NUS Surface Science Lab at 1600 hours. Please contact for appointment