WELCOME TO ADVANCED INTEGERATED ANALYTICAL TEST SERVICES
Innovative metrology and characterization are becoming critical for development of nano/micro circuit technology and clean technology cluster. The progressive introduction of new materials, novel processing and assembly, and innovative devices bring forth formidable metrology and diagnostic challenges in recent years due to rapid consumerization of silicon by the new generation. Advanced characterization has thus become a key enabler in improving nano-scale process technology as well as solar cell / LED manufacturing. A-IATS, as your first port of call addresses your analytical and test challenges on continual basis with its physical assets and intellectual capital arising from research labs and regional manufacturers. AIATS enables you to link composition, structure, morphology, roughness, adhesion and hardness with defect reduction, yield improvement and optimum performance enhancement for variation management.
Dec 2016 Souvenir Hardcopy(Click Here)
A new symposium on IC INTERCONNECT RELIABILITY of advanced electronic package is being planned at Utown, NUS, Singapore on Sep 2017. All are invited. Please refer to this website or www.microsurftech.com for more details soon.
Contact Dr Gopal Krishnan at email@example.com
We invite you for a free technical consultation every Tuesday at NUS Surface Science Lab or at E MAGIC Lab at 1630 hours. Please contact firstname.lastname@example.org for appointment